Description
Impact device D / DC
Equotip Impact Device D / DC with impact body, support rings, cleaning brush, cable.
Application
Most commonly used probe. For the majority of applications.
Impact device G
Equotip Impact Device G with impact body, support rings, cleaning brush, cable.
Application
Large and heavy components, e.g. casts and forged parts.
Impact device DL
Equotip Impact Device DL with impact body, support rings, cleaning brush, cable.
Application
Narrow indenter (probe) tip for measurement on hard reach areas or spaces with limited access
Impact device E
Equotip Impact Device E with impact body, support rings, cleaning brush, cable.
Application
For measurements in extreme hardness ranges. Tool steels with high carbide content.
Impact device S
Equotip Impact Device S with impact body, support rings, cleaning brush, cable.
Application
For measurements in extreme hardness ranges. Tool steels with a high carbide content.
Impact device C
Equotip Impact Device C with impact body, support rings, cleaning brush, cable.
Application
For surface hardened components, coatings, thin or impact-sensitive parts.